超竞真空技术（上海）有限公司

The IGM 300 Integrated imaging system is a complete secondary electron / ion imaging package, providing beam rastering and scanning capabilities, low-noise detection and amplification, and comprehensive imaging and control software.

System Includes:

Channeltron-based secondary electron/ion detector
SED power supply
Scan controller with integrated frame grabber
Scan amplifier
Scan controller with integrated frame grabber
Imaging & control software

Detector

The detector can be mounted onto a vacuum chamber via its NW35CF conflat flange. It has a standard flange to nose length of 146 mm with adjustment over ± 8 mm.
The assembly contains:

Electron multiplier design with high gain stability and low noise giving exceptional performance.
Compact close-coupled high performance pre-amplifier.

SED Power Supply

The power supply is contained in a 2U high x 19″ chassis and provides all the necessary supplies for the detector and preamplifier.

Digitally controlled analogue filter:

Provides user programmable signal filtering over a wide range of frequencies.

Electron/ion selection

The unit is able to support switching the detector between positive ion and negative electron detection mode, automatically setting the optimum voltage potentials for each mode.

Imaging Interface Software

The imaging interface provides full control for the SED and raster controllers. Slowscan images can be acquired and displayed live on screen at up to 2048 pixels resolution. Other features include: